Huntron Access Probers

Features:

• Automatic guided probe to measure voltages or waveforms on specific points of a PCA
• Automatic stimulus and fault injection to a specific point on a PCA
• Automate monitoring of temperature or EMI on a PCA in a non-invasive way
• Use as “guided finger” to automate mechanical movements such as pressing keys on a keypad
• Use as a guided camera for basic automated optical inspection applications

Description:

The Huntron® Access Probers are designed to accurately access test points on printed circuit assemblies (PCAs). It's 20 micron accuracy achieved by micro-stepping and linear encoding ensures reliable probing of the smallest surface mounted components. By using either the standard built-in test probe or a custom test probe, the Huntron Access Prober adds flying probe technology to your new or existing equipment. The high-resolution color camera ensures correct probe placement and provides a clear view of the PCA under test.

The open design of the Huntron Access Prober and it's software drivers allow you to design and implement your own custom test stations. Drivers are provided with the Huntron Access Prober for custom application development in National Instruments LabVIEW or LabWindows/CVI.

Save time, money and boards.

The Huntron Access Probers can be customized for your own application by developing application software. Huntron Access Probers can troubleshoot boards you can't test on a bed-of-nails system because of pin density or physical limitations. Even if it's physically possible to build a custom test bed for a board, the high cost of doing so, and then programming the test routine, makes is cost-prohibitive to troubleshoot in low volumes. Huntron Probers eliminate the cost of custom fixtures making it economical to test a large variety of boards.

Instead of returning a failed board from a critical system to the manufacturer (or returning the entire system), you can find and replace faulty components. If you manufacture equipment with complex, densely packed boards, you can replace faulty components instead of discarding otherwise good boards.

Huntron Access Probers utilize a built-in color camera system to target component pins for testing. Using the Huntron Workstation software, component positions are referenced to alignment points selected at the beginning of the test creation. Teaching package types such as dual-inline, single-inline, quad and multi-row is made easy by targeting on-screen cross hairs on component pins or pads. Key points on the component such as the first, last and diagonal pins are used to quickly locate and teach the remaining pins.
Components can be automatically scanned individually or by entire sections. The component signatures are stored for comparison for use when scanning suspect circuit boards.

Huntron Access Probers connect to the Huntron ProTrack , the new Tracker Model 30 , TrackerPXI or order an Access Prober with the Tracker Model 30 built-in for an all-in-one test solution. Huntron Access Probers allow for economical, automated testing of densely packed surface-mount and other devices on the most complex boards from the smallest to the largest systems.

The precision robotic movement lets you probe points on the newest exotic chips, such as PLCCs, SOICs, PGAs, SSOPs, QFPs and others, without any expensive fixturing or programming required.

Supplied Accessories with Probers

Specifications

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